Can Combination of Low-Level Laser and Light-Emitting Diodes Enhance Stability of Dental Implants?

Use Low-Level Laser and Light-Emitting Diodes in Dental Implants

Status

Completed

Phases

Study type

Interventional

Source

ClinicalTrials.gov

Registry ID

NCT03362307

Enrollment

Registered

2017-12-05

Start date

2014-01-01

Completion date

2015-09-30

Last updated

2017-12-05

For informational purposes only — not medical advice. Sourced from public registries and may not reflect the latest updates. Terms

Conditions

Dental Implant Healing

Keywords

Low-Level Light Therapy, Osseointegration

Brief summary

Subjects were assigned in two groups: In group 1, subjects received LLL and LED 20 min/day for 10 days after implant insertion, subjects in group 2did not undergo LLL and LED. implant stability quotients(ISQs) were measured in 0,10,21,42 and 63 days after implant placement.

Detailed description

Subjects eligible for study inclusion had an edentulous area at the first molar of the mandible and needed a dental implant. Subjects were excluded from study enrollment if they had any diseases that affect bone, smoking, insufficient bone in the edentulous area which needs bone augmentation, failed to return for follow-up, or refused study enrollment. All implants were placed at least 3 months after tooth removal. The size of implants was 4.8X 10 mm (Zimmer, USA) Subjects were aligned based on computer randomization in two groups: In group 1(intervention), subjects received LLL and LED after implant placement and in group 2 (control) the same device was used while device was off. A portable device was applied for irradiation of the intervention group with combination of 810nm laser and 632nm LED. Subjects in group 1 underwent LLL 15 mw/cm2 and LED 10 mw/cm2 20 min every day for 10 days. The mesiodistal and buccolingual directions were measured and the mean implant stability quotients (ISQs) were determined. The RFA measurements were performed in immediate after insertion (time0) 10 days (time1), 3 weeks (time2), 6 weeks(time3) and 9(time 4) weeks after implant placement.

Interventions

DEVICELow-Level Laser and Light-Emitting Diodes

Combination of Low-Level Laser and Light-Emitting Diodes were used after dental implant placement for enhancement of stability

DEVICEDental implant placement

A dental implant with 4.8X 10 mm (Zimmer, USA) size was placed at the posterior of the mandible

Study design

Allocation

RANDOMIZED

Intervention model

PARALLEL

Primary purpose

OTHER

Masking

NONE

Intervention model description

Subjects were aligned based on computer randomization in two groups: In group 1(intervention), subjects received LLL and LED after implant placement and in group 2 (control) the same device was used while device was off.

Eligibility

Sex/Gender

ALL

Age

18 Years to No maximum

Healthy volunteers

Yes

Inclusion criteria

* subjects eligible for study inclusion had an edentulous area at the first molar of the mandible and needed a dental implant

Exclusion criteria

* . Subjects were excluded from study enrollment if they had any diseases that affect bone, smoking, insufficient bone in the edentulous area which needs bone augmentation, failed to return for follow-up, or refused study enrollment.

Design outcomes

Primary

Measure	Time frame	Description
Resonance frequency analysis	Immidate after implant placement (time 0)	The stability of the implants was evaluated with resonance frequency analysis by the Osstell device

Outcome results

None listed

Source: ClinicalTrials.gov · Data processed: Feb 4, 2026