Auditory attention processing in prelingually deaf children with bilateral cochlear implants Ear, Nose and Throat
Conditions
Interventions
Sponsors
Eligibility
Inclusion criteria
Inclusion criteria: Cochlear Implant (CI) Group: 1. Prelingually deaf children 2. Bilateral cochlear implant users 3. Age range 7-14 years 4. Minimum 4 years of CI experience 5. Regular CI users with consistent device use For Normal-Hearing (NH) Control Group: 1. Age-matched children: 2. Normal hearing thresholds (=20 dB HL across frequencies) 3. No history of hearing disorders 4. No neurological disorders General Criteria for Both Groups: 1. No additional disabilities 2. Normal cognitive development 3. Written informed consent from parents/guardians 4. Ability to follow test instructions 5. Native language (Hebrew or Arabic speakers, balanced between groups)
Exclusion criteria
Exclusion criteria: For Both Groups: 1. Additional disabilities beyond hearing loss (for the CI group) 2. Diagnosed neurological disorders 3. Cognitive impairments 4. Attention deficit disorders 5. Inability to complete all testing sessions Specific to CI Group: 1. Irregular/inconsistent CI use 2. Device complications or malfunctions 3. Post-lingual deafness 4. Unilateral cochlear implant Specific to NH Control Group: 1. Any history of hearing loss 2. Hearing thresholds >20 dB HL at any frequency 3. History of middle ear pathology 4. Current or recent use of medications affecting cognitive function
Design outcomes
Primary
| Measure | Time frame |
|---|---|
| 1. Automatic attention processing is measured using frontal Novelty P3 amplitudes and latencies from ERP recordings during an oddball paradigm at one testing session 2. Controlled attention processing is measured using parietal Target P3 amplitudes and latencies from ERP recordings during an oddball paradigm at one testing session | — |
Secondary
| Measure | Time frame |
|---|---|
| 1. Speech perception in noise is measured using the Speech-in-Noise test at one testing session 2. Short-term memory capacity is measured using Forward Digit Span and working memory capacity is measured using Backward Digit Span (test at one testing session) | — |
Countries
Israel