TO EVALUATE THE EFFECTIVENESS OF LOW LEVEL LASER THERAPY (LLLT) USING 810nm DIODE LASER ON IMPLANT STABILITY MEASURED BY RESONANCE FREQUENCY ANALYSIS (RFA) A RANDOMIZED CONTROLLED CLINICAL TRIAL

To Evaluate The Effectiveness Of Low Level Laser Therapy (LLLT) Using 810nm Diode Laser On Implant Stability Measured By Resonance Frequency Analysis (RFA) A Randomized Controlled Clinical Trial - NIL

Status

Active, not recruiting

Phases

Phase 4

Study type

Interventional

Source

CTRI

Registry ID

CTRI/2026/01/100334

Enrollment

Registered

2026-01-05

Start date

Unknown

Completion date

Unknown

Last updated

2026-02-02

For informational purposes only — not medical advice. Sourced from public registries and may not reflect the latest updates. Terms

Conditions

None listed

Interventions

Intervention1: LLLT(Low Level Laser Therapy): Low-level laser therapy with a wavelength of 810nm wavelength, a measured power output of 50mW and a spot size of 0.4cm2 will be applied in six points (80

energy density=11 J/cm2) prior to the preparation of the bone bed. After suturing, Low-level laser therapy (LLLT) will be applied at same points again. Control Intervention1: NIL: NIL

Eligibility

Inclusion criteria

Inclusion criteria: 1. Patients with age group greater than equals to 21years. 2. Patients should have at least one healed edentulous site in mandible. 3. Patients should have adequate bone dimensions for implant placement without the need for guided bone regeneration procedure. 4. The insertion torque 30 to 60 N.cm 5. Patients should be systemically healthy. 6. Patients who are willing and available for recall and follow-ups.

Exclusion criteria

Exclusion criteria: 1. Patients with uncontrolled systemic diseases, pregnant and lactating women. 2. Patients who are current/ex-smoker or consume any other form of tobacco. 3. Patients who need advanced surgical procedure for implant placement 4. Patients have history of radiation therapy in the head and neck region.

Design outcomes

Primary

Measure	Time frame
1) RFA (Resonance Frequency Analysis) to measure Implant Stability. 2) Radiographic evaluation.Timepoint: 1) RFA (Resonance Frequency Analysis) to measure Implant Stability- at baseline, 2 weeks,4 weeks,8 weeks,12 weeks 2) Radiographic evaluation-at baseline,3 months	—

Secondary

Measure	Time frame
secondary outcome 1) Plaque index (PI) 2) Gingival index (GI)Timepoint: 1) Plaque index (PI)-at baseline,3 months 2) Gingival index (GI)-at baseline,3 months	—

Countries

India

Contacts

Public ContactDr Lakshay saini

JN Kapoor DAV (c) Yamunanagar

lakshayssainis@gmail.com09416060126

Outcome results